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XPS as an advanced method for analysis of organic materials
- 1.ARTEMENKO, Anna, ŠTENCLOVÁ, Pavla, BABČENKO, Oleg, WÅGBERG, T., SEGERVALD, J., JIA, X., SHCHUKAREV, A., MARTON, M., VOJS, M., KROMKA, Alexander. XPS as an advanced method for analysis of organic materials. In: KOŽÍŠEK, Z., KRÁL, R., ZEMENOVÁ, P., eds. Book of Abstracts of the 30th Joint Seminar of the Development of Materials Science in Research and Education. Praha: Institute of Physics of the Czech Academy of Sciences, 2020, s. 17-17. ISBN 978-80-907237-1-9.
Number of the records: 1