Determining the accuracy of qSTEM for use in electron beam induced mass loss studies

Number of the records: 1

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SYSNO ASEP	0521680
Document Type	A - Abstract
R&D Document Type	The record was not marked in the RIV
R&D Document Type	Není vybrán druh dokumentu
Title	Determining the accuracy of qSTEM for use in electron beam induced mass loss studies
Author(s)	Skoupý, Radim (UPT-D)_{RID, ORCID, SAI} Krzyžánek, Vladislav (UPT-D)_{RID, ORCID, SAI}
Number of authors	2
Source Title	Microscopy 2019. - Praha : Československá mikroskopická společnost, 2019 S. 104-105
Number of pages	2 s.
Publication form	Print - P
Action	Microscopy 2019
Event date	13.05.2019 - 15.05.2019
VEvent location	Lednice na Moravě
Country	CZ - Czech Republic
Event type	EUR
Language	eng - English
Country	CZ - Czech Republic
Keywords	qSTEM ; electron beam inducte
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
OECD category	Nano-materials (production and properties)
R&D Projects	GA17-15451S GA ČR - Czech Science Foundation (CSF)
	FV30271 GA MPO - Ministry of Industry and Trade (MPO)
Institutional support	UPT-D - RVO:68081731
Annotation	Quantitative STEM (qSTEM) imaging is a powerful method for determination of thickness, mass and mass per area/lenght.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2020

Number of the records: 1