Number of the records: 1
Investigation of stacking faults in MOVPE-grown zincblende GaN by XRD and TEM
SYS 0506256 LBL 01000a^^22220027750^450 005 20240103222233.4 014 $a 85062849811 $2 SCOPUS 014 $a 000461370200024 $2 WOS 017 70
$a 10.1063/1.5082846 $2 DOI 100 $a 20190712d m y slo 03 ba 101 0-
$a eng $d eng 102 $a US 200 1-
$a Investigation of stacking faults in MOVPE-grown zincblende GaN by XRD and TEM 215 $a 8 s. 463 -1
$1 001 cav_un_epca*0256872 $1 011 $a 0021-8979 $e 1089-7550 $1 200 1 $a Journal of Applied Physics $v Roč. 125, č. 10 (2019) $1 210 $c AIP Publishing 608 $a Article 610 $a Epilayers 610 $a Gallium nitride 610 $a High resolution transmission electron microscopy 610 $a III-V semiconductors 610 $a Silicon carbide 610 $a Stacking faults 610 $a X ray diffraction 610 $a Zinc sulfide 700 -1
$3 cav_un_auth*0376912 $a Lee $b Lok Y. $y GB $4 070 701 -1
$3 cav_un_auth*0376913 $a Frentrup $b M. $y GB $4 070 701 -1
$3 cav_un_auth*0376914 $a Vacek $b Petr $p UFM-A $i Elektrické a magnetické vlastnosti $j Electrical and magnetic properties $4 070 $T Ústav fyziky materiálů AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0376915 $a Kappers $b Menno J. $y GB $4 070 701 -1
$3 cav_un_auth*0376916 $a Wallis $b David J. $y GB $4 070 701 -1
$3 cav_un_auth*0376917 $a Oliver $b Rachel A. $y GB $4 070 856 $u http://orca.cf.ac.uk/120129/1/Wallis%20D%20-%20Investigation%20of%20stacking%20faults%20in%20MOVPE-grown%20....pdf $9 RIV
Number of the records: 1