Number of the records: 1
Investigation of stacking faults in MOVPE-grown zincblende GaN by XRD and TEM
- 1.Lee, L. Y., Frentrup, M., Vacek, P., Kappers, M. J., Wallis, D. J., Oliver, R. A. Investigation of stacking faults in MOVPE-grown zincblende GaN by XRD and TEM. Journal of Applied Physics. 2019, 125(10), 105303. ISSN 0021-8979. E-ISSN 1089-7550. Available: doi: 10.1063/1.5082846.
Number of the records: 1