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Investigation of stacking faults in MOVPE-grown zincblende GaN by XRD and TEM
- 1.LEE, L. Y., FRENTRUP, M., VACEK, P., KAPPERS, M. J., WALLIS, D. J., OLIVER, R. A. Investigation of stacking faults in MOVPE-grown zincblende GaN by XRD and TEM. Journal of Applied Physics. 2019, 125(10), 105303. ISSN 0021-8979. E-ISSN 1089-7550. Available: doi: 10.1063/1.5082846.
Number of the records: 1