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More features, more tools, more CrysTBox
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SYSNO ASEP 0479945 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title More features, more tools, more CrysTBox Author(s) Klinger, Miloslav (FZU-D) ORCID Number of authors 1 Source Title Journal of Applied Crystallography. - : Wiley - ISSN 0021-8898
Roč. 50, Part 4 (2017), s. 1226-1234Number of pages 9 s. Language eng - English Country GB - United Kingdom Keywords electron diffraction ; automated analysis ; transmission electron-microscopy ; high-resolution transmission electron microscopy ; visualization Subject RIV BM - Solid Matter Physics ; Magnetism OECD category Condensed matter physics (including formerly solid state physics, supercond.) R&D Projects GBP108/12/G043 GA ČR - Czech Science Foundation (CSF) Institutional support FZU-D - RVO:68378271 UT WOS 000407040700027 EID SCOPUS 85026898297 DOI 10.1107/S1600576717006793 Annotation A new release of the CrysTBox software is introduced. The original toolbox allows for an automated analysis of transmission electron microscope (TEM)images and for crystallographic visualization. The existing tools, which are capable of highly precise analyses of high-resolution TEM images, as well as spot, disc and ring diffractio patterns, are extended to include a tool for automatically measuring TEM sample thickness using convergent beam electron diffraction in a two-beam approximation. An implementation of geometric phase analysis is newly available, employing one of the existing tools to identify parameters and indices of crystallographic planes depicted in the input image and allowing easier and more accurate analysis.
Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2018
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