Difraction in a scanning electron microscopie

Number of the records: 1

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SYSNO	0460211
Title	Difraction in a scanning electron microscopie
Author(s)	Řiháček, Tomáš (UPT-D)_{RID, ORCID} Mika, Filip (UPT-D)_{RID, SAI, ORCID} Matějka, Milan (UPT-D)_{RID, ORCID, SAI} Krátký, Stanislav (UPT-D)_{RID, ORCID, SAI} Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID}
Source Title	Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. S. 56-57. - Brno : Institute of Scientific Instruments CAS, 2016 / Mika Filip
Conference	International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, 29.05.2016 - 03.06.2016, Skalský dvůr
Document Type	Konferenční příspěvek (zahraniční konf.)
Grant	TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR), CZ - Czech Republic
	LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
	ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
Institutional support	UPT-D - RVO:68081731
Language	eng
Country	CZ
Keywords	electron microscopy * TEM * STEM
URL	http://www.trends.isibrno.cz/
Permanent Link	http://hdl.handle.net/11104/0260343

Number of the records: 1