Number of the records: 1
Noncontact Atomic Force Microscopy
- 1.0456646 - FZÚ 2016 RIV CH eng M - Monography Chapter
Hapala, Prokop - Ondráček, Martin - Stetsovych, Oleksandr - Švec, Martin - Jelínek, Pavel
Simultaneous nc-AFM/STM measurements with atomic resolution.
Noncontact Atomic Force Microscopy. Cham: Springer International Publishing, 2015 - (Morita, S.; Giessibl, F.; Meyer, E.; Wiesendanger, R.), s. 29-49. NanoScience and Technology, 3. ISBN 978-3-319-15587-6
R&D Projects: GA ČR(CZ) GA14-02079S
Institutional support: RVO:68378271
Keywords : AFM * STM * DFT simulations * electron transport * atomic contrast
Subject RIV: BM - Solid Matter Physics ; Magnetism
We discuss the history and recent progress of simultaneous AFM/STM measurements with atomic resolution. We demonstrate, that the technique can provide complex information about chemical and physical processes at atomic scale as well as about material properties of surfaces and nanostructures. We briefly overview one of the most fascinating achievements, high-resolution imaging with functionalized tips.
Permanent Link: http://hdl.handle.net/11104/0257148
Number of the records: 1