Number of the records: 1
Quantitative Data Processing in Scanning Probe Microscopy
- 1.0423743 - FZÚ 2014 RIV GB eng M - Monography Chapter
Klapetek, P. - Fejfar, Antonín - Rezek, Bohuslav
Local current measurements.
Quantitative Data Processing in Scanning Probe Microscopy. Oxford: Elsevier, 2013 - (Klapetek, P.), s. 221-245. Micro and Nano Technologies. ISBN 978-1-4557-3058-2
R&D Projects: GA MŠMT(CZ) LM2011026
Institutional support: RVO:68378271
Keywords : STM * AFM * local electronic properties * nanostructures
Subject RIV: BM - Solid Matter Physics ; Magnetism
http://www.sciencedirect.com/science/book/9781455730582
Two groups of techniques based on local current flow between probe and sample in a Scanning Probe Microscope (SPM) are reviewed. Scanning tunneling microscopy and spectroscopy (STM, STS) is typically used in ultrahigh vacuum conditions for measurements of very high resolution images of atomic lattices surface reconstructions. We discuss its basics and related modeling and data interpretation approaches. Conductive Atomic Force Microscopy (C-AFM) is more often used in ambient conditions, to map local electrical properties of samples and to estimate local sample resistance based material contrast maps. Tip-sample junction models and typical artifacts of C-AFM are discussed, being illustrated by measurements on semiconducting samples, like microcrystalline solar cells.
Permanent Link: http://hdl.handle.net/11104/0229821
Number of the records: 1