Light trapping abilities of silicon thin films measured by Raman spectroscopy

Number of the records: 1

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SYSNO	0386621
Title	Light trapping abilities of silicon thin films measured by Raman spectroscopy
Author(s)	Ledinský, Martin (FZU-D)_{RID, ORCID, SAI} Hakl, M. (CZ) Ondič, Lukáš (FZU-D)_{RID, ORCID} Ganzerová, K. (CZ) Vetushka, Aliaksi (FZU-D)_{RID, ORCID} Fejfar, Antonín (FZU-D)_{RID, ORCID, SAI} Kočka, Jan (FZU-D)_{RID, ORCID, SAI}
Source Title	Proceedings of the 27th European Photovoltaic Solar Energy Conference and Exhibition. S. 2431-2433. - München : WIP Wirtschaft und Infrastruktur GmbH & Co Planungs KG, 2012 / Nowak S.
Conference	European Photovoltaic Solar Energy Conference and Exhibition (PVSEC) /17./, 24.09.2012-28.09.2012, Frankfurt
Document Type	Konferenční příspěvek (zahraniční konf.)
Grant	7E10061 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	240826, XE - EU countries
	LM2011026 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
	FR-TI2/736 GA MPO - Ministry of Industry and Trade (MPO)
CEZ	AV0Z10100521 - FZU-D (2005-2011)
Language	eng
Country	DE
Keywords	light trapping * polycrystalline silicon (Si) * thin film solar cell * Raman spectoscopy
Permanent Link	http://hdl.handle.net/11104/0215916

Number of the records: 1