Number of the records: 1  

Light trapping abilities of silicon thin films measured by Raman spectroscopy

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    SYSNO ASEP0386621
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleLight trapping abilities of silicon thin films measured by Raman spectroscopy
    Author(s) Ledinský, Martin (FZU-D) RID, ORCID, SAI
    Hakl, M. (CZ)
    Ondič, Lukáš (FZU-D) RID, ORCID
    Ganzerová, K. (CZ)
    Vetushka, Aliaksi (FZU-D) RID, ORCID
    Fejfar, Antonín (FZU-D) RID, ORCID, SAI
    Kočka, Jan (FZU-D) RID, ORCID, SAI
    Source TitleProceedings of the 27th European Photovoltaic Solar Energy Conference and Exhibition. - München : WIP Wirtschaft und Infrastruktur GmbH & Co Planungs KG, 2012 / Nowak S. - ISBN 3-936338-28-0
    Pagess. 2431-2433
    Number of pages3 s.
    Publication formMedium - C
    ActionEuropean Photovoltaic Solar Energy Conference and Exhibition (PVSEC) /17./
    Event date24.09.2012-28.09.2012
    VEvent locationFrankfurt
    CountryDE - Germany
    Event typeEUR
    Languageeng - English
    CountryDE - Germany
    Keywordslight trapping ; polycrystalline silicon (Si) ; thin film solar cell ; Raman spectoscopy
    Subject RIVBM - Solid Matter Physics ; Magnetism
    R&D Projects7E10061 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LM2011026 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    FR-TI2/736 GA MPO - Ministry of Industry and Trade (MPO)
    CEZAV0Z10100521 - FZU-D (2005-2011)
    DOI10.4229/27thEUPVSEC2012-3CV.2.24
    AnnotationRaman spectroscopy is used as a tool for measuring the light trapping abilities of thin crystalline silicon films for photovoltaic applications. Comparison of samples with different scattering characteristic is reported and the significant difference in the absolute Raman intensities is explained by light trapping effects. Raman spectroscopy is proposed as a promising tool for in-line characterization of silicon thin films during fabrication of solar cell modules.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2013
Number of the records: 1  

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