Number of the records: 1
Light trapping abilities of silicon thin films measured by Raman spectroscopy
- 1.Ledinský, Martin - Hakl, M. - Ondič, Lukáš - Ganzerová, K. - Vetushka, Aliaksi - Fejfar, Antonín - Kočka, Jan
Light trapping abilities of silicon thin films measured by Raman spectroscopy.
Proceedings of the 27th European Photovoltaic Solar Energy Conference and Exhibition. München: WIP Wirtschaft und Infrastruktur GmbH & Co Planungs KG, 2012 - (Nowak, S.), s. 2431-2433. ISBN 3-936338-28-0.
[European Photovoltaic Solar Energy Conference and Exhibition (PVSEC) /17./. Frankfurt (DE), 24.09.2012-28.09.2012]
http://hdl.handle.net/11104/0215916
Number of the records: 1