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Light trapping abilities of silicon thin films measured by Raman spectroscopy
- 1.Ledinský, M., Hakl, M., Ondič, L., Ganzerová, K., Vetushka, A., Fejfar, A., Kočka, J. Light trapping abilities of silicon thin films measured by Raman spectroscopy. In: NOWAK, S., ed. Proceedings of the 27th European Photovoltaic Solar Energy Conference and Exhibition. München: WIP Wirtschaft und Infrastruktur GmbH & Co Planungs KG, 2012, s. 2431-2433. ISBN 3-936338-28-0. Available: doi: 10.4229/27thEUPVSEC2012-3CV.2.24
Number of the records: 1