Number of the records: 1
Mapping of dopants in silicon by injection of electrons
- 1.Hovorka, Miloš - Konvalina, Ivo - Frank, Luděk - Mikulík, P.
Mapping of dopants in silicon by injection of electrons.
MC 2011 - Microscopy Conference Kiel. Kiel: DGE, 2011, IM7.P198:1-2. ISBN 978-3-00-033910-3.
[MC 2011 - Microscopy Conference. Kiel (DE), 28.08.2011-02.09.2011]
http://hdl.handle.net/11104/0202020
Number of the records: 1