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Surface Diagnostics using Low-Coherence Interferometry and Colour Single CCD Camera
- 1.0352195 - ÚPT 2011 RIV CA eng C - Conference Paper (international conference)
Buchta, Zdeněk - Mikel, Břetislav - Lazar, Josef - Číp, Ondřej
Surface Diagnostics using Low-Coherence Interferometry and Colour Single CCD Camera.
Proceedings of the International Conference on Nanotechnology: Fundamentals and Applications. Ottawa: International ASET, 2010, 517: 1-6. ISBN 978-0-9867183-0-4.
[Nanotechnology: Fundamentals and Applications. Ottawa (CA), 04.08.2010-06.08.2010]
R&D Projects: GA ČR GP102/09/P293; GA ČR GP102/09/P630; GA MPO 2A-1TP1/127; GA MŠMT ED0017/01/01; GA MŠMT(CZ) LC06007
Institutional research plan: CEZ:AV0Z20650511
Keywords : low-coherence interferometry * surface diagnostics * CCD camera * white-light fringe analysis
Subject RIV: BH - Optics, Masers, Lasers
We describe in this paper a pilot experiment of a white-light fringe analysis with a low-cost color CCD camera. The used detection technique employs the phase-crossing algorithm which identifies the zero optical path difference as the point where the phase difference between the red, green and blue part of the white-light interference fringe becomes equal to zero. An experimental arrangement is based on superluminescent LED diode. The experimental setup is designed to be a crucial part of the complex system for automatic contactless diagnostic and calibration of gauge blocks.
Permanent Link: http://hdl.handle.net/11104/0191765
Number of the records: 1