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Scintillation SE Detector for Variable Pressure Scanning Electron Microscope
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SYSNO ASEP 0315080 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Scintillation SE Detector for Variable Pressure Scanning Electron Microscope Title Scintilační detektor sekundárních elektronů pro vysokotlaký rastrovací elektronový mikroskop Author(s) Jirák, Josef (UPT-D) RID
Černoch, P. (CZ)
Neděla, Vilém (UPT-D) RID, ORCID, SAI
Špinka, J. (CZ)Source Title EMC 2008 - 14th European Microscopy Congress - Volume 1: Instrumentation and Methods. - Berlin : Springer, 2008 / Luysberg M. ; Tillmann K. ; Weirich T. - ISBN 978-3-540-85154-7 Pages s. 559-560 Number of pages 2 s. Action EMC 2008 - European Microscopy Congress /14./ Event date 01.09.2008-05.09.2008 VEvent location Aachen Country DE - Germany Event type WRD Language eng - English Country DE - Germany Keywords VPSEM ; secondary electrons detector ; scintillatíon detector Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering CEZ AV0Z20650511 - UPT-D (2005-2011) Annotation The article deals with an introduction to signals detection in the variable pressure scanning electron microscope (VPSEM) and to a new scintillation secondary electron detector for VPSEM. The presented successful operation of the detector is supported by images of several specimens. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2009
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