Number of the records: 1
Scintillation SE Detector for Variable Pressure Scanning Electron Microscope
- 1.0315080 - ÚPT 2009 RIV DE eng C - Conference Paper (international conference)
Jirák, Josef - Černoch, P. - Neděla, Vilém - Špinka, J.
Scintillation SE Detector for Variable Pressure Scanning Electron Microscope.
[Scintilační detektor sekundárních elektronů pro vysokotlaký rastrovací elektronový mikroskop.]
EMC 2008 - 14th European Microscopy Congress - Volume 1: Instrumentation and Methods. Berlin: Springer, 2008 - (Luysberg, M.; Tillmann, K.; Weirich, T.), s. 559-560. ISBN 978-3-540-85154-7.
[EMC 2008 - European Microscopy Congress /14./. Aachen (DE), 01.09.2008-05.09.2008]
Institutional research plan: CEZ:AV0Z20650511
Keywords : VPSEM * secondary electrons detector * scintillatíon detector
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0004851
Number of the records: 1