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Real structure characterization by x-ray diffraction

  1. 1.
    SYSNO0308658
    TitleReal structure characterization by x-ray diffraction
    TitleCharakterizace reálné struktrury pomocí rtg difrakce
    Author(s) Drahokoupil, Jan (FZU-D) RID, ORCID
    Michalcová, A. (CZ)
    Gärtnerová, Viera (FZU-D) RID, ORCID
    Kopeček, Jaromír (FZU-D) RID, ORCID
    Hrabánek, Pavel (UFCH-W) RID
    Source Title SEMDOK 2008. S. 5-8. - Žilina : University of Žilina, 2008 / Bokůvka O.
    Conference SEMDOK 2008, Súĺov, 31.01.2008-01.02.2008
    Document TypeKonferenční příspěvek (zahraniční konf.)
    Grant GA106/06/0019 GA ČR - Czech Science Foundation (CSF)
    GA106/07/0805 GA ČR - Czech Science Foundation (CSF)
    CEZAV0Z10100520 - FZU-D (2005-2011)
    AV0Z40400503 - UFCH-W (2005-2011)
    Languageeng
    CountrySK
    Keywords X-ray diffraction * structure * phases
    Permanent Linkhttp://hdl.handle.net/11104/0161068
     
Number of the records: 1  

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