Number of the records: 1
Real structure characterization by x-ray diffraction
- 1.Drahokoupil, Jan - Michalcová, A. - Gärtnerová, Viera - Kopeček, Jaromír - Hrabánek, Pavel
Real structure characterization by x-ray diffraction.
SEMDOK 2008. Žilina: University of Žilina, 2008 - (Bokůvka, O.), s. 5-8. ISBN 978-80-8070-796-5.
[SEMDOK 2008. Súĺov (SK), 31.01.2008-01.02.2008]
http://hdl.handle.net/11104/0161068
Number of the records: 1