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Real structure characterization by x-ray diffraction
- 1.Drahokoupil, J., Michalcová, A., Gärtnerová, V., Kopeček, J., Hrabánek, P. Real structure characterization by x-ray diffraction. In: BOKŮVKA, O., ed. SEMDOK 2008. Žilina: University of Žilina, 2008, s. 5-8. ISBN 978-80-8070-796-5.
Number of the records: 1