Emission of volatile degradation products from polymers irradiated with heavy ions to different fluences

0185528 - UJF-V 20020031 RIV US eng J - Journal Article
Hnatowicz, Vladimír - Vacík, Jiří - Švorčík, J. - Rybka, V. - Ryssel, H. - Kluge, A.
Emission of volatile degradation products from polymers irradiated with heavy ions to different fluences.
Radiation Effects and Defects in Solids. Roč. 155, 1-4 (2002), s. 195-202. ISSN 1042-0150. E-ISSN 1029-4953
R&D Projects: GA ČR GA203/99/1626
Keywords : polymers * ion irradiation * hydrogen * oxygen * depth profiles
Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders
Impact factor: 0.290, year: 2002

Polyimide (Upilex), polyethyleneterephtalate, polystyrene and polyethylene were irradiated with 20-200 KeV C+, N+, F+, Ar and Xe+ ions to the fluences up to 10(17)cm(-2) and the depth profiles of hydrogen and oxygen atoms in the polymer surface layer were determined using standard Rutherford Back-Scattering (RBS) and Elastic Recoil Detection (ERD) techniques. The H and O depth profiles are structureless with no local extremes and with the concentration monotonically increasing from the sample surface to the bulk value typical for pristine polymer. The H and O contents in the irradiated surface layer remain unchanged up to a criticll fluence, which is a decrasing function of the energy density deposited by an ion. Then they decline rather rapidly and converge to 50-70% of their original values of unirradiated polymer. The decline rate is roughly the same for all ion/polymer combinations regardless of the ion mass and energy.
Permanent Link: http://hdl.handle.net/11104/0081922