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Detection Strategies for Collection of Secondary Electrons in SEM

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    SYSNO ASEP0092207
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleDetection Strategies for Collection of Secondary Electrons in SEM
    TitleDetekční strategie pro sběr sekundárních elektronů v REM
    Author(s) Konvalina, Ivo (UPT-D) RID, ORCID, SAI
    Hovorka, Miloš (UPT-D)
    Wandrol, Petr (UPT-D)
    Mika, Filip (UPT-D) RID, SAI, ORCID
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Source TitleProceedings of the 8th Multinational Congress on Microscopy. - Prague : Czechoslovak Microscopy Society, 2007 / Nebesářová Jana ; Hozák Pavel - ISBN 978-80-239-9397-4
    Pagess. 91-92
    Number of pages2 s.
    ActionMultinational Congress on Microscopy /8./
    Event date17.06.2007-21.06.2007
    VEvent locationPrague
    CountryCZ - Czech Republic
    Event typeEUR
    Languageeng - English
    CountryCZ - Czech Republic
    Keywordsdetection ; secondary electrons ; SEM
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    R&D ProjectsGA102/05/2327 GA ČR - Czech Science Foundation (CSF)
    CEZAV0Z20650511 - UPT-D (2005-2011)
    AnnotationIn the scanning electron microscope (SEM), the secondary electrons (SE) are usually detected by the Everhart-Thornley (ET) type detector, using a weak electrostatic field to attract low energy SE let us call it the standard system. This principle is employed for more than forty years. Modern SEMs achieve their improved image resolution by allowing the strong magnetic field of the objective lens (OL) to penetrate to the specimen surface (so called immersion system). Two SE detectors are usually used in this case: one is below the OL just as the standard ET detector (lower detector) and the other is positioned above the OL (upper detector). The final contrast of SE images for the same specimen varies with the energy and angular sensitivity of the detectors, connected with specific distributions of the electrostatic and magnetic fields in the specimen region.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2008
Number of the records: 1  

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