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Depth profile CF LIBS analysis of the wall deposited layer in the COMPASS tokamak after LiSn testing campaign
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SYSNO ASEP 0581954 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Depth profile CF LIBS analysis of the wall deposited layer in the COMPASS tokamak after LiSn testing campaign Author(s) Shetty, N. (CZ)
Veis, M. (CZ)
Atikukke, S. (SK)
Bartoň, Petr (UFP-V)
Jeřáb, Martin (UFP-V) ORCID
Dejarnac, Renaud (UFP-V) RID, ORCID
Veis, P. (SK)Number of authors 0 Article number 101547 Source Title Nuclear Materials and Energy. - : Elsevier
Roč. 37, December (2023)Number of pages 5 s. Language eng - English Country NL - Netherlands Keywords Calibration free (CF) approach ; Deposited layer analysis ; Depth profile ; Fusion plasma wall interaction ; Laser-induced breakdown spectroscopy (LIBS) ; Li and Sn migration ; Liquid metal divertor (LMD) Subject RIV BL - Plasma and Gas Discharge Physics OECD category Fluids and plasma physics (including surface physics) Method of publishing Open access Institutional support UFP-V - RVO:61389021 UT WOS 001111436500001 EID SCOPUS 85176505689 DOI 10.1016/j.nme.2023.101547 Annotation Plasma-facing materials in tokamak nuclear reactors are subject to intense heat and radiation. The design of liquid metal (LM) divertor walls has several advantages over the solid counterparts. It is important to understand the migration and re-deposition of LMs such as lithium (Li), lead (Pb) or even tin (Sn). This work presents CF LIBS depth profile analysis of the deposited layer on Ni–Cr based screws situated at different places in the COMPASS tokamak vessel during the Capillary Porous System (CPS) LM (LiSn) divertor testing campaign. The experiment was carried out at low Ar pressure (100 mbar) using ns Nd:YAG laser operating at 532 nm. The spectra were recorded using echelle spectrometer (M5000, Andor Tech.) equipped with an iCCD camera (iStar DH743, Andor Tech.). The quantification was based on observed C I, B I, Li I and (weak) Sn I lines, in addition to trace elements (Ca, Na, K) and main matrix elements (Cr, Ni, Fe). The evaluation of electron temperature and density was based on Cr I-II, Ni-II and Fe I-II lines. The LM based content is estimated to be Li (0.3-0.81 at.%) and Sn (0.1-0.23 at.%) with Li/Sn at.% ratio ranging from 3 to 3.5 (wt.% ratio of 0.17-0.20). In practise, the limit of detection of Sn by CF LIBS for this type of Cr-Ni-Fe based matrix is observed to be ∼0.1 at.%. Workplace Institute of Plasma Physics Contact Vladimíra Kebza, kebza@ipp.cas.cz, Tel.: 266 052 975 Year of Publishing 2024 Electronic address https://www.sciencedirect.com/science/article/pii/S2352179123001862?via%3Dihub
Number of the records: 1