Shear strain induced recrystallization/recovery phenomena within rotary swaged Al/Cu composite conductors

0563338 - ÚFM 2023 RIV US eng J - Journal Article
Kunčická, Lenka - Kocich, Radim - Jambor, Michal
Shear strain induced recrystallization/recovery phenomena within rotary swaged Al/Cu composite conductors.
Materials Characterization. Roč. 194, DEC (2022), č. článku 112399. ISSN 1044-5803. E-ISSN 1873-4189
Institutional support: RVO:68081723
Keywords : Copper * Rotary swaging * Dynamic recrystallization * Electroconductivity
OECD category: Composites (including laminates, reinforced plastics, cermets, combined natural and synthetic fibre fabrics
Impact factor: 4.7, year: 2022
Method of publishing: Limited access
https://www.sciencedirect.com/science/article/pii/S1044580322006817?via%3Dihub

The presented study aims to assess the effects of room temperature rotary swaging on structure, dynamic restoration processes in particular, within newly designed Al/Cu composite conductors. Swaging was processed from the original diameter of 50 mm (assembled billets) to the diameters of 20 mm, 15 mm, and 10 mm (final conductors). Cross-sectional samples of the swaged conductors were subjected to thorough structure analyses via electron microscopy, analyses of HV0.2 Vickers microhardness and specific electric resistivity were performed to supplement the study. Swaging to 15 mm primarily imparted structure recovery, while the final swaging to 10 mm introduced dynamic recrystallization within both the composite components (the fractions of high angle grain boundaries within Al and Cu were 78.7%, and 74.2%, respectively). The 10 mm composite Cu also featured increased fraction of Cube (Euler angles of φ1 = 0°, ϕ = 0°, and φ2 = 0°) ideal recrystallization texture orientation. As regards the specific electric resistivity, this parameter was influenced primarily by accumulated dislocations, grain size and arrangement (e.g. bimodal distribution), as well as possible presence of texture. The lowest specific electric resistivity of 20.589 Ωm·10−9 was measured for the 15 mm conductor exhibiting dynamic restoration. The Cu component of this composite also featured the highest HV0.2 Vickers microhardness value.
Permanent Link: https://hdl.handle.net/11104/0335328