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Radiation-induced phase separation in nanostructured Hf-In-C ternary thin films under irradiation with 200 keV Ar.sup.+./sup. ion beam
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SYSNO ASEP 0562898 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Radiation-induced phase separation in nanostructured Hf-In-C ternary thin films under irradiation with 200 keV Ar+ ion beam Author(s) Vacík, J. (CZ)
Cannavó, A. (CZ)
Bakardjieva, S. (CZ)
Kupčík, Jaroslav (FZU-D) ORCID
Lavrentiev, V. (CZ)
Ceccio, G. (CZ)
Horák, P. (CZ)
Němeček, J. (CZ)
Verna, A. (IT)
Parmeggiani, M. (IT)
Calcagno, L. (IT)
Klie, R. (US)
Duchoň, Jan (FZU-D) ORCID, RIDNumber of authors 13 Source Title Radiation Effects and Defects in Solids. - : Taylor & Francis - ISSN 1042-0150
Roč. 177, 1-2 (2022), s. 137-160Number of pages 24 s. Language eng - English Country GB - United Kingdom Keywords ion beam synthesis ; Hf-In-C nanocomposite ; Hf2InC MAX phase ; HfC0.95 phase ; radiation tolerance Subject RIV BM - Solid Matter Physics ; Magnetism OECD category Condensed matter physics (including formerly solid state physics, supercond.) R&D Projects LM2018110 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Method of publishing Limited access Institutional support FZU-D - RVO:68378271 UT WOS 000770467000001 EID SCOPUS 85126828743 DOI 10.1080/10420150.2022.2049788 Annotation After fabrication the Hf-In-C nanostructures a part of the pristine (as deposited) samplex was irradiated by 200 KeV Ar.+. ions at high fluences 10.15. and 10.17. cm.-2.. Both samples (as prepared and irradiated)were analyzed by IBA nuclear analytical methods, as well as by AFM and TEM microscopic techniques, and by XPS and profilometry to understand the microstructural evolution. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2023 Electronic address https://doi.org/10.1080/10420150.2022.2049788
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