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Powder nano-beam diffraction in scanning electron microscope: fast and simple method for analysis of nanoparticle crystal structure
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SYSNO ASEP 0541840 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Powder nano-beam diffraction in scanning electron microscope: fast and simple method for analysis of nanoparticle crystal structure Author(s) Šlouf, Miroslav (UMCH-V) RID, ORCID
Skoupý, Radim (UPT-D) RID, ORCID, SAI
Pavlova, Ewa (UMCH-V) RID
Krzyžánek, Vladislav (UPT-D) RID, ORCID, SAIArticle number 962 Source Title Nanomaterials. - : MDPI
Roč. 11, č. 4 (2021)Number of pages 17 s. Language eng - English Country CH - Switzerland Keywords nanoparticle analysis ; powder nanobeam electron diffraction ; 4D-STEM/PNBD Subject RIV CB - Analytical Chemistry, Separation OECD category Analytical chemistry Subject RIV - cooperation Institute of Scientific Instruments - Electronics ; Optoelectronics, Electrical Engineering R&D Projects GA21-13541S GA ČR - Czech Science Foundation (CSF) TN01000008 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) Method of publishing Open access Institutional support UMCH-V - RVO:61389013 ; UPT-D - RVO:68081731 UT WOS 000643393700001 EID SCOPUS 85103859671 DOI 10.3390/nano11040962 Annotation We introduce a novel scanning electron microscopy (SEM) method which yields powder electron diffraction patterns. The only requirement is that the SEM microscope must be equipped with a pixelated detector of transmitted electrons. The pixelated detectors for SEM have been commercialized recently. They can be used routinely to collect a high number of electron diffraction patterns from individual nanocrystals and/or locations (this is called four-dimensional scanning transmission electron microscopy (4D-STEM), as we obtain two-dimensional (2D) information for each pixel of the 2D scanning array). Nevertheless, the individual 4D-STEM diffractograms are difficult to analyze due to the random orientation of nanocrystalline material. In our method, all individual diffractograms (showing randomly oriented diffraction spots from a few nanocrystals) are combined into one composite diffraction pattern (showing diffraction rings typical of polycrystalline/powder materials). The final powder diffraction pattern can be analyzed by means of standard programs for TEM/SAED (Selected-Area Electron Diffraction). We called our new method 4D-STEM/PNBD (Powder NanoBeam Diffraction) and applied it to three different systems: Au nano-islands (well diffracting nanocrystals with size ~20 nm), small TbF3 nanocrystals (size < 5 nm), and large NaYF4 nanocrystals (size > 100 nm). In all three cases, the STEM/PNBD results were comparable to those obtained from TEM/SAED. Therefore, the 4D-STEM/PNBD method enables fast and simple analysis of nanocrystalline materials, which opens quite new possibilities in the field of SEM. Workplace Institute of Macromolecular Chemistry Contact Eva Čechová, cechova@imc.cas.cz ; Tel.: 296 809 358 Year of Publishing 2022 Electronic address https://www.mdpi.com/2079-4991/11/4/962
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