Number of the records: 1
Measurements of single event upset in ATLAS IBL
- 1.
SYSNO 0539534 Title Measurements of single event upset in ATLAS IBL Author(s) Balbi, G. (IT)
Barbero, M. (DE)
Beccherle, R. (IT)
Bindi, M. (DE)
Breugnon, P. (FR)
Butti, P. (CH)
Cinca, D. (DE)
Dickinson, J. (US)
Ferrere, D. (CH)
Fougeron, D. (FR)
Garcia-Sciveres, M. (US)
Pascual, J.G. (CN)
Gaudiello, A. (IT)
Gemme, C. (IT)
Giangiacomi, N. (IT)
Hemperek, T. (DE)
Jeanty, L. (US)
Kepka, Oldřich (FZU-D) RID, ORCID
Kocian, M. (US)
Lantzsch, K. (DE)
Liu, P. (US)
Martin, C. (US)
Mekkaoui, A. (US)
Menouni, M. (FR)
Potamianos, K. (US)
Rozanov, A. (FR)
Takubo, Y. (JP)
Wensing, M. (DE)Source Title Journal of Instrumentation. Roč. 15, č. 6 (2020), s. 1-30. - : Institute of Physics Publishing Article number P06023 Document Type Článek v odborném periodiku Grant LTT17018 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic Institutional support FZU-D - RVO:68378271 Language eng Country GB Keywords semiconductor detector: pixel * noise * ATLAS * electronics: readout URL http://hdl.handle.net/11104/0317254 Permanent Link http://hdl.handle.net/11104/0317254 File Download Size Commentary Version Access 0539534.pdf 0 10.3 MB CC licence Publisher’s postprint open-access
Number of the records: 1