Measurements of single event upset in ATLAS IBL

Balbi, G.; Barbero, M.; Beccherle, R.; Bindi, M.; Breugnon, P.; Butti, P.; Cinca, D.; Dickinson, J.; Ferrere, D.; Fougeron, D.; Garcia-Sciveres, M.; Pascual, J.G.; Gaudiello, A.; Gemme, C.; Giangiacomi, N.; Hemperek, T.; Jeanty, L.; Kepka, Oldřich; Kocian, M.; Lantzsch, K.; Liu, P.; Martin, C.; Mekkaoui, A.; Menouni, M.; Potamianos, K.; Rozanov, A.; Takubo, Y.; Wensing, M.

doi:https://dx.doi.org/10.1088/1748-0221/15/06/P06023

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Measurements of single event upset in ATLAS IBL

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SYSNO ASEP	0539534
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Measurements of single event upset in ATLAS IBL
Author(s)	Balbi, G. (IT) Barbero, M. (DE) Beccherle, R. (IT) Bindi, M. (DE) Breugnon, P. (FR) Butti, P. (CH) Cinca, D. (DE) Dickinson, J. (US) Ferrere, D. (CH) Fougeron, D. (FR) Garcia-Sciveres, M. (US) Pascual, J.G. (CN) Gaudiello, A. (IT) Gemme, C. (IT) Giangiacomi, N. (IT) Hemperek, T. (DE) Jeanty, L. (US) Kepka, Oldřich (FZU-D)_{RID, ORCID} Kocian, M. (US) Lantzsch, K. (DE) Liu, P. (US) Martin, C. (US) Mekkaoui, A. (US) Menouni, M. (FR) Potamianos, K. (US) Rozanov, A. (FR) Takubo, Y. (JP) Wensing, M. (DE)
Number of authors	28
Article number	P06023
Source Title	Journal of Instrumentation. - : Institute of Physics Publishing - ISSN 1748-0221 Roč. 15, č. 6 (2020), s. 1-30
Number of pages	30 s.
Language	eng - English
Country	GB - United Kingdom
Keywords	semiconductor detector: pixel ; noise ; ATLAS ; electronics: readout
Subject RIV	BF - Elementary Particles and High Energy Physics
OECD category	Particles and field physics
R&D Projects	LTT17018 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
Research Infrastructure	CERN-CZ II - 90104 - Fyzikální ústav AV ČR, v. v. i.
Method of publishing	Open access
Institutional support	FZU-D - RVO:68378271
UT WOS	000545350900023
EID SCOPUS	85088516061
DOI	10.1088/1748-0221/15/06/P06023
Annotation	Effects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system. SEU/SET affect the FE-I4B Global Registers as well as the settings for the individual pixels, causing, among other things, occupancy losses, drops in the low voltage currents, noisy pixels, and silent pixels. Quantitative data analysis and simulations indicate that SET dominate over SEU on the load line of the memory. Operational issues and mitigation techniques are presented.
Workplace	Institute of Physics
Contact	Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
Year of Publishing	2021
Electronic address	http://hdl.handle.net/11104/0317254

Number of the records: 1