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Non-destructive depth profile reconstruction of single-layer graphene using angle-resolved X-ray photoelectron spectroscopy
- 1.Zemek, J., Houdková, J., Jiříček, P., Ižák, T., Kalbáč, M. Non-destructive depth profile reconstruction of single-layer graphene using angle-resolved X-ray photoelectron spectroscopy. Applied Surface Science. 2019, 491(Oct), 16-23. ISSN 0169-4332. E-ISSN 1873-5584. Available: doi: 10.1016/j.apsusc.2019.06.083.
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