Number of the records: 1  

Suppressed contamination of InGaN/GaN MQW region by growing the buffer layer at lower temperature

  1. 1.
    SYSNO ASEP0501495
    Document TypeA - Abstract
    R&D Document TypeThe record was not marked in the RIV
    R&D Document TypeNení vybrán druh dokumentu
    TitleSuppressed contamination of InGaN/GaN MQW region by growing the buffer layer at lower temperature
    Author(s) Hospodková, Alice (FZU-D) RID, ORCID, SAI
    Dominec, Filip (FZU-D) RID, ORCID
    Hubáček, Tomáš (FZU-D) ORCID
    Zíková, Markéta (FZU-D) RID
    Pangrác, Jiří (FZU-D) RID, ORCID, SAI
    Oswald, Jiří (FZU-D) RID, ORCID
    Kuldová, Karla (FZU-D) RID, ORCID
    Vetushka, Aliaksi (FZU-D) RID, ORCID
    Hulicius, Eduard (FZU-D) RID, ORCID, SAI
    Number of authors9
    Source TitleICMOVPE XIX - Technical Digest. - Nara : Japanese Association for Crystal Growth, 2018 / Miyake H.
    S. 147-147
    Number of pages1 s.
    Publication formOnline - E
    Action19th International Conference on Metalorganic Vapor Phase Epitaxy - ICMOVPE XIX
    Event date03.06.2018 - 08.06.2018
    VEvent locationNara
    CountryJP - Japan
    Event typeWRD
    Languageeng - English
    CountryJP - Japan
    KeywordsGaN buffer layer ; scintillators ; low dimensional structures ; V-pits ; metalorganic vapor phase epitaxy ; InGaN/GaN QWs
    Subject RIVBM - Solid Matter Physics ; Magnetism
    OECD categoryCondensed matter physics (including formerly solid state physics, supercond.)
    R&D ProjectsLO1603 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    GA16-15569S GA ČR - Czech Science Foundation (CSF)
    Institutional supportFZU-D - RVO:68378271
    AnnotationFast response of scintillators based on InGaN/GaN multiple quantum wells is compromised by slower luminescence defect band of unknown origin. SIMS analysis suggests that impurities concentrate in the quantum-well region, due to a drop in growth temperature. Using MOVPE we have prepared a set of samples with additional low-temperature buffer GaN layers to keep the impurities farther from the quantum wells. Our spectroscopic measurements have confirmed that this modification indeed results in enhancement of the fast luminescence component and reduction of the slow one. AFM images for two samples that differ mostly by morphology however points to another explanation, with formation of larger V-pits being the main reason for the luminescence improvement.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2019
Number of the records: 1  

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