Number of the records: 1
Very low energy electron microscopy of graphene flakes
- 1.
SYSNO ASEP 0395127 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Very low energy electron microscopy of graphene flakes Author(s) Mikmeková, Eliška (UPT-D) RID
Bouyanfif, H. (FR)
Lejeune, M. (FR)
Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Hovorka, Miloš (UPT-D)
Unčovský, M. (CZ)
Frank, Luděk (UPT-D) RID, SAI, ORCIDNumber of authors 7 Source Title Journal of Microscopy. - : Wiley - ISSN 0022-2720
Roč. 251, č. 2 (2013), s. 123-127Number of pages 5 s. Publication form Print - P Language eng - English Country GB - United Kingdom Keywords graphene ; very low energy STEM Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering R&D Projects GAP108/11/2270 GA ČR - Czech Science Foundation (CSF) TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support UPT-D - RVO:68081731 UT WOS 000321618700003 EID SCOPUS 84880258537 DOI 10.1111/jmi.12049 Annotation Commercially available graphene samples are examined by Raman spectroscopy and very low energy scanning transmission electron microscopy. Limited lateral resolution of Raman spectroscopy may produce a Raman spectrum corresponding to a single graphene layer even for flakes that can be identified by very low energy electron microscopy as an aggregate of smaller flakes of various thicknesses. In addition to diagnostics of graphene samples at larger dimensions, their electron transmittance can also be measured at very low energies. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2014
Number of the records: 1