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Mechanical and electrical properties of microcrystalline silicon thin films
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SYSNO 0375338 Title Mechanical and electrical properties of microcrystalline silicon thin films Author(s) Vetushka, Aliaksi (FZU-D) RID, ORCID Issue data Praha: Univerzita Karlova, 2010 Academic degree Ph.D. Place of presentation and defence Matematicko-fyzikální fakulta UK Affiliation Matematicko-fyzikální fakulta UK Document Type Dizertace Grant LC06040 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic MEB061012 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic KAN400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) 240826, XE - EU countries CEZ AV0Z10100521 - FZU-D (2005-2011) Language eng Country CZ Keywords conductive atomic force microscopy * raman micro-spectroscopy * microcrystalline silicon URL http://dl.dropbox.com/u/26071625/AV_PhD.pdf Permanent Link http://hdl.handle.net/11104/0208019
Number of the records: 1