Number of the records: 1  

Mechanical and electrical properties of microcrystalline silicon thin films

  1. 1.
    SYSNO0375338
    TitleMechanical and electrical properties of microcrystalline silicon thin films
    Author(s) Vetushka, Aliaksi (FZU-D) RID, ORCID
    Issue dataPraha: Univerzita Karlova, 2010
    Academic degreePh.D.
    Place of presentation and defenceMatematicko-fyzikální fakulta UK
    AffiliationMatematicko-fyzikální fakulta UK
    Document TypeDizertace
    Grant LC06040 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
    MEB061012 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
    KAN400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    240826, XE - EU countries
    CEZAV0Z10100521 - FZU-D (2005-2011)
    Languageeng
    CountryCZ
    Keywords conductive atomic force microscopy * raman micro-spectroscopy * microcrystalline silicon
    URL http://dl.dropbox.com/u/26071625/AV_PhD.pdf
    Permanent Linkhttp://hdl.handle.net/11104/0208019
     
Number of the records: 1  

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