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An elastically Bent silicon monochromator for a neutron diffractometer
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SYSNO ASEP 0185150 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Ostatní články Title An elastically Bent silicon monochromator for a neutron diffractometer Author(s) Tanaka, I. (JP)
Niimura, N. (JP)
Mikula, Pavol (UJF-V) RID, ORCID, SAISource Title Journal of Applied Crystallography. - : Wiley - ISSN 1600-5767
Roč. 32, - (1999), s. 525-529Number of pages 5 s. Language eng - English Country DK - Denmark Subject RIV BG - Nuclear, Atomic and Molecular Physics, Colliders R&D Projects GV202/97/K038 GA ČR - Czech Science Foundation (CSF) KSK1048601 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) Annotation A new type of elastically bent perfect Si (EBP-Si) monochromator for a neutron diffractometer, dedicated to protein crystallography, has been developed and successfully applied to two such diffractometers. I propose the following sentence: It was experimentally demonstrated that using a focusing effect as well as an increase of the effective mosaicity of an optimally EBP-Si monochromator, flux density ofmonochromatic neutrons at the sample position has been substantially increased. A specifically designed bender for the EBP-Si, which has already been applied to several diffractometers, is described. The distinctive features of the EBP-Si are summarized. Workplace Nuclear Physics Institute Contact Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Year of Publishing 2001
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