Number of the records: 1
Residual Stress Determination by Whole Pattern Analysis-Application to Synchrotron HEXRD Measurements on Thermal Sprayed Coatings
- 1.Gnaeupel-Herold, T., Haeffner, D. R., Prask, H. J., Matějíček, J. Residual Stress Determination by Whole Pattern Analysis-Application to Synchrotron HEXRD Measurements on Thermal Sprayed Coatings. In: Proceedings of the 6th International Conference on Residual Stresses. London: IOM Communications Ltd., 2000, s. 751-758.
Number of the records: 1