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Residual Stress Determination by Whole Pattern Analysis-Application to Synchrotron HEXRD Measurements on Thermal Sprayed Coatings
- 1.GNAEUPEL-HEROLD, T., HAEFFNER, D. R., PRASK, H. J., MATĚJÍČEK, J. Residual Stress Determination by Whole Pattern Analysis-Application to Synchrotron HEXRD Measurements on Thermal Sprayed Coatings. In: Proceedings of the 6th International Conference on Residual Stresses. London: IOM Communications Ltd., 2000, s. 751-758.
Number of the records: 1