Number of the records: 1
Multiply charged ion-induced secondary electron emission from metals relevent for laser source beam diagnostics
- 1.0133992 - FZU-D 20020280 RIV US eng J - Journal Article
Láska, Leoš - Krása, Josef - Stöckli, M. P. - Fehrenbach, C. W.
Multiply charged ion-induced secondary electron emission from metals relevent for laser source beam diagnostics.
Review of Scientific Instruments. Roč. 73, č. 2 (2002), s. 776-778. ISSN 0034-6748. E-ISSN 1089-7623
R&D Projects: GA AV ČR IAA1010819; GA AV ČR IAA1010105; GA MŠMT LN00A100
Institutional research plan: CEZ:AV0Z1010921
Keywords : ion-induced secondary electron emission * laser ion source beam diagnostics
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 1.437, year: 2002
The number of secondary electrons, emitted when multiply charged ions impact on metallic probe surface was measured to make the quantitative ion diagnostics based on this process more precise.
Permanent Link: http://hdl.handle.net/11104/0031938
Number of the records: 1