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Change exchange of Si ions with clean and I-covered Al(100)
- 1.0024811 - ÚFE 2006 RIV US eng C - Conference Paper (international conference)
Chen, X. - Šroubek, Zdeněk - Yarmoff, J. A.
Change exchange of Si ions with clean and I-covered Al(100).
[Nábojová výměna Si-iontů s čistým a I-pokrytým Al(100).]
2005 APS March Meeting. Los Angeles: American Physical Society, 2005, s. 96-97.
[APS March Meeting [0045991]. Los Angeles (US), 21.03.2005-25.03.2005]
Institutional research plan: CEZ:AV0Z20670512
Keywords : ionisation * sputtering
Subject RIV: BM - Solid Matter Physics ; Magnetism
Si ions were incident on an atomically clean Al (100). This was the first experiment when low energy Si+ was used as the projectile. Ions from Al were emitted in the form of Al+, Al++ and Al+++ and their relative intensities varied with I coverage. Specifically, Si scattered from I was studied in detail.
V experimentu Si ionty dopadaly na atomicky čistý Al (100). Toto byl první experiment kdy Si+ byl použit jako nizkoenergetický projektil. Emitované ionty byly ve formě Al+, Al++ and Al+++ a jejich relativní intensity se měnily s I pokrytím. Detailně byl studovan rozptyl Si atomu na I
Permanent Link: http://hdl.handle.net/11104/0115298
Number of the records: 1