Number of the records: 1  

Localized modification of graphene oxide properties by laser irradiation in vacuum

  1. 1.
    SYSNO ASEP0505696
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleLocalized modification of graphene oxide properties by laser irradiation in vacuum
    Author(s) Cutroneo, Mariapompea (UJF-V) ORCID, RID, SAI
    Torrisi, L. (IT)
    Havránek, Vladimír (UJF-V) RID, SAI, ORCID
    Macková, Anna (UJF-V) RID, ORCID, SAI
    Malinský, Petr (UJF-V) RID, ORCID, SAI
    Torrisi, Alfio (UJF-V) RID, ORCID
    Silipigni, L. (IT)
    Fernandes, Sandrina (UJF-V)
    Sofer, Z. (CZ)
    Stammers, James H. (UJF-V)
    Number of authors10
    Source TitleVacuum. - : Elsevier - ISSN 0042-207X
    Roč. 165, č. 7 (2019), s. 134-138
    Number of pages5 s.
    Publication formPrint - P
    Action17th Joint Vacuum Conference (JVC)
    Event date10.09.2018 - 14.09.2018
    VEvent locationOlomouc
    CountryCZ - Czech Republic
    Event typeEUR
    Languageeng - English
    CountryGB - United Kingdom
    Keywordslaser irradiation ; graphene oxide ; graphene oxide film
    Subject RIVBG - Nuclear, Atomic and Molecular Physics, Colliders
    OECD categoryMaterials engineering
    R&D ProjectsLM2015056 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    GA16-05167S GA ČR - Czech Science Foundation (CSF)
    Method of publishingLimited access
    Institutional supportUJF-V - RVO:61389005
    UT WOS000470047600020
    EID SCOPUS85064319286
    DOI10.1016/j.vacuum.2019.04.012
    AnnotationModifications induced by nanosecond Nd:YAG laser irradiation in the graphene oxide properties were investigated. To correlate the effects of laser irradiation with the modifications of the structural, chemical and electrical properties of graphene oxide, 2.5 MeV alpha particle and 2.0 MeV proton beams in Rutherford back scattering spectrometry and elastic recoil detection analysis, and also X-ray photoemission spectroscopy, have been employed. A high ratio of carbon to oxygen atoms was measured in the irradiated graphene oxide, with respect to the virgin one. The localized reduction of graphene oxide film is promising for patterning techniques useful for the graphene-based devices production.
    WorkplaceNuclear Physics Institute
    ContactMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Year of Publishing2020
    Electronic addresshttps://doi.org/10.1016/j.vacuum.2019.04.012
Number of the records: 1  

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