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Characterisation of materials by scanning low energy electron microscope
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SYSNO ASEP 0481029 Document Type A - Abstract R&D Document Type The record was not marked in the RIV R&D Document Type Není vybrán druh dokumentu Title Characterisation of materials by scanning low energy electron microscope Author(s) Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
Mikmeková, Eliška (UPT-D) RID
Konvalina, Ivo (UPT-D) RID, ORCID, SAI
Pokorná, Zuzana (UPT-D) RID, ORCID, SAI
Frank, Luděk (UPT-D) RID, SAI, ORCIDNumber of authors 6 Source Title 3rd Forum of Center for Advanced Materials Research and International Collaboration (CAMRIC-FORAM3). 13th Light Metals International Workshop By Japan Institute of Light Metals. - Toyama : University of Toyama, 2017
S. 14-15Number of pages 2 s. Publication form Print - P Action Forum of Center for Advanced Materials Research and International Collaboration (CAMRIC-FORAM3) /3./. Light Metals International Workshop By Japan Institute of Light Metals /13./ Event date 12.10.2017 - 13.10.2017 VEvent location Toyama Country JP - Japan Event type WRD Language eng - English Country JP - Japan Keywords LEEM ; ultra-fine grains ; ultrahigh strength ; super plasticity Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering OECD category Nano-materials (production and properties) R&D Projects TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support UPT-D - RVO:68081731 Annotation Nowadays materials with ultra-fine grains are developed. They are very attractive for many industrial applications because of their interesting machanical and physical properties including ultrahigh strength and super plasticity. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2018
Number of the records: 1