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Magnetoresistance effects associated with various electric conduction mechanisms in nanostructured [C/FeCo]n multilayers
- 1.0470617 - ÚPT 2017 RIV NL eng J - Journal Article
Zeng, Y.P. - Liu, Z.W. - Mikmeková, Eliška
Magnetoresistance effects associated with various electric conduction mechanisms in nanostructured [C/FeCo]n multilayers.
Journal of Magnetism and Magnetic Materials. Roč. 421, January (2017), s. 39-43. ISSN 0304-8853. E-ISSN 1873-4766
Institutional support: RVO:68081731
Keywords : magnetoresistance * thin film * microstructure * conduction regime
OECD category: Coating and films
Impact factor: 3.046, year: 2017
An evolution of magnetoresistance (MR) mechanism with the film structure was discovered in nanostructured [C/FeCo]n thin films fabricated by magnetron sputtering. The discontinuous multilayer nanogranular structure was confirmed by microstructure characterization. As the layer number n increased, the MR value of the film changed from positive to negative. The fitting curves of lnR−T−1/2 and lnR−T−1/4 show that there is a transition of the conduction regime in the temperature range of 2–300 K. The significant different MR effects at various conduction regimes indicated that the type of transport regime plays an important role in MR origin.
Permanent Link: http://hdl.handle.net/11104/0268199
Number of the records: 1