Practical Use of Scanning Low Energy Electron Microscope (SLEEM)

Number of the records: 1

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SYSNO	0465457
Title	Practical Use of Scanning Low Energy Electron Microscope (SLEEM)
Author(s)	Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID} Mikmeková, Eliška (UPT-D)_RID Mikmeková, Šárka (UPT-D)_{RID, SAI, ORCID} Konvalina, Ivo (UPT-D)_{RID, ORCID, SAI} Frank, Luděk (UPT-D)_{RID, SAI, ORCID}
Source Title	Microscopy and Microanalysis. Roč. 22, S3 (2016), s. 1650-1651. - : Cambridge University Press
Document Type	Článek v odborném periodiku
Grant	TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR), CZ - Czech Republic
	LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
	ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
Institutional support	UPT-D - RVO:68081731
Language	eng
Country	US
Keywords	scanning low energy * SLEEM
Permanent Link	http://hdl.handle.net/11104/0264011

Number of the records: 1