Number of the records: 1
Practical Use of Scanning Low Energy Electron Microscope (SLEEM)
- 1.Müllerová, Ilona - Mikmeková, Eliška - Mikmeková, Šárka - Konvalina, Ivo - Frank, Luděk
Practical Use of Scanning Low Energy Electron Microscope (SLEEM).
Microscopy and Microanalysis. Roč. 22, S3 (2016), s. 1650-1651. ISSN 1431-9276. E-ISSN 1435-8115
Impact factor: 1.891, year: 2016
http://hdl.handle.net/11104/0264011
Number of the records: 1