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3D analysis of microstructure changes occurring during creep tests of ultra-fine grained materials
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SYSNO 0435649 Title 3D analysis of microstructure changes occurring during creep tests of ultra-fine grained materials Author(s) Král, Petr (UFM-A) RID, ORCID
Dluhoš, J. (CZ)
Peřina, P. (CZ)
Barták, T. (CZ)Source Title Recrystallization and Grain Growth V. S. 46-49. - Stafa-Zurich : Trans Tech Publications, 2013 / Barnett M. Conference ReX&GG V - International Conference on Recrystallization and Grain Growth /5/, 05.05.2013-10.05.2013, Sydney Document Type Konferenční příspěvek (zahraniční konf.) Institutional support UFM-A - RVO:68081723 Language eng Country CH Keywords Recrystallization * ECAP * Creep * 3D EBSD * Focused Ion Beam Permanent Link http://hdl.handle.net/11104/0239454
Number of the records: 1