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Scanning Electron Microscopy With Slow Electrons
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SYSNO ASEP 0398028 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Ostatní články Title Scanning Electron Microscopy With Slow Electrons Author(s) Frank, Luděk (UPT-D) RID, SAI, ORCID
Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
Pokorná, Zuzana (UPT-D) RID, ORCID, SAI
Müllerová, Ilona (UPT-D) RID, SAI, ORCIDNumber of authors 4 Source Title Microscopy and Microanalysis. - : Cambridge University Press - ISSN 1431-9276
Roč. 19, S2 (2013), s. 372-373Number of pages 2 s. Publication form Print - P Language eng - English Country US - United States Keywords Scanning Electron Microscopy ; Slow Electrons ; Grain Contrast ; Contrast of the Density of States ; Angle-resolved BSE Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering R&D Projects GAP108/11/2270 GA ČR - Czech Science Foundation (CSF) TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) Institutional support UPT-D - RVO:68081731 DOI 10.1017/S1431927613003851 Annotation Scanning low energy electron microscopy (SLEEM) with a catode lens provides improved image resolution at low energies, an enhanced signal of secondary electrons, a completely collected signal of backscattered electron (BSE) including very low energy electrons that are traditionally abandoned, and plenty of contrast mechnism not available with fast incident electrons. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2014
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