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Determination of single microcrystalline silicon grains preferential crystallographic orientation by polarized Raman spectroscopy
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SYSNO ASEP 0373735 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Determination of single microcrystalline silicon grains preferential crystallographic orientation by polarized Raman spectroscopy Author(s) Ledinský, Martin (FZU-D) RID, ORCID, SAI
Vetushka, Aliaksi (FZU-D) RID, ORCID
Stuchlík, Jiří (FZU-D) RID, ORCID
Fejfar, Antonín (FZU-D) RID, ORCID, SAI
Kočka, Jan (FZU-D) RID, ORCID, SAISource Title XXII International Conference on Raman Spectroscopy. - Melville : AIP, 2010 / Champion P.M. ; Ziegler L.D. - ISBN 978-0-7354-0818-0 Pages s. 1109-1110 Number of pages 2 s. Action International Conference on Raman Spectroscopy /22./ Event date 08.08.2010-13.08.2010 VEvent location Boston Country US - United States Event type WRD Language eng - English Country US - United States Keywords Raman ; microcrystalline silicon ; atomic force microscopy Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects LC06040 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) KAN400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z10100521 - FZU-D (2005-2011) UT WOS 000281210900584 Annotation Thin films of microcrystalline silicon (μc-Si:H) are intensively studied mainly for thin film solar cells. All structural and material properties of μc-Si:H significantly depend on the crystalline volume fraction and the crystallographic orientation of the grains. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2012
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