Number of the records: 1  

Combined detector for BSE, SE and BSE+SE detection in a low voltage SEM

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    SYSNO ASEP0205508
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleCombined detector for BSE, SE and BSE+SE detection in a low voltage SEM
    Author(s) Autrata, Rudolf (UPT-D)
    Jirák, Josef (UPT-D) RID
    Romanovský, Vladimír (UPT-D)
    Špinka, Jiří (UPT-D)
    Source TitleProceedings of the 8th international seminar, held in Skalský dvůr / Frank L.. - Brno : Ústav přístrojové techniky Akademie věd České republiky, 2002 - ISBN 80-238-8986-9
    Pagess. 49 - 50
    Number of pages2 s.
    ActionRecent trends in charged particle optics and surface physics instrumentation
    Event date08.07.2002-12.07.2002
    VEvent locationSkalský dvůr
    CountryCZ - Czech Republic
    Event typeWRD
    Languageeng - English
    CountryCZ - Czech Republic
    Keywordslow accelerating voltage ; electrons beam ; Everhart-Thornley
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    R&D ProjectsGA102/01/1271 GA ČR - Czech Science Foundation (CSF)
    CEZAV0Z2065902 - UPT-D
    AnnotationSpecimen observation at a low accelerating voltage of the electron beam (around 1kV) is a new and attractive technique of scanning electron microscopy. While detection to the signal of secondary electrons (SE) with the help of the scintillation-photomultiplier system described by Everhart-Thornley does not depend on the primary beam energy, the detection of backscattered electrons (BSE), having their energy only a bit lower than energy of the beam, is limited by a low sensitivity of semiconductor or channel plate detectors to channel plate detectors to electrons of energy below 2 keV.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2003

Number of the records: 1  

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