Optical refraction index and polarization profile of ferroelectric thin films

Number of the records: 1

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SYSNO	0133868
Title	Optical refraction index and polarization profile of ferroelectric thin films
Author(s)	Glinchuk, M. D. (UA) Eliseev, E. A. (UA) Deineka, Alexander (FZU-D) Jastrabík, Lubomír (FZU-D)_{RID, ORCID} Suchaneck, G. (DE) Sandner, T. (DE) Gerlach, G. (DE) Hrabovský, Miroslav (FZU-D)_{RID, ORCID}
Source Title	Integrated Ferroelectrics. Roč. 38, 1-4 (2001), s. 101-110
Document Type	Článek v odborném periodiku
Grant	LN00A015 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	GA202/00/1425 GA ČR - Czech Science Foundation (CSF)
CEZ	AV0Z1010914 - FZU-D
Language	eng
Country	GB
Keywords	thin film * refraction index * polarization * film thickness
Permanent Link	http://hdl.handle.net/11104/0031819

Number of the records: 1