Optical refraction index and polarization profile of ferroelectric thin films

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SYSNO ASEP	0133868
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Ostatní články
Title	Optical refraction index and polarization profile of ferroelectric thin films
Author(s)	Glinchuk, M. D. (UA) Eliseev, E. A. (UA) Deineka, Alexander (FZU-D) Jastrabík, Lubomír (FZU-D)_{RID, ORCID} Suchaneck, G. (DE) Sandner, T. (DE) Gerlach, G. (DE) Hrabovský, Miroslav (FZU-D)_{RID, ORCID}
Source Title	Integrated Ferroelectrics - ISSN 1058-4587 Roč. 38, 1-4 (2001), s. 101-110
Number of pages	10 s.
Language	eng - English
Country	GB - United Kingdom
Keywords	thin film ; refraction index ; polarization ; film thickness
Subject RIV	BM - Solid Matter Physics ; Magnetism
R&D Projects	LN00A015 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	GA202/00/1425 GA ČR - Czech Science Foundation (CSF)
CEZ	AV0Z1010914 - FZU-D
Annotation	Analytical calculations of polarization and optical refraction index in ferroelectric thin films are performed in the framework of thermodynamic theory. The thickness dependence of the optical refraction index was found to be proportional to squared polarization.
Workplace	Institute of Physics
Contact	Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
Year of Publishing	2003

Number of the records: 1