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Fabrication and Characterization of Thermally Oxidized Tungsten-Based Thin Films for Application in Cold Field Emission Sources
SYS 0584784 LBL 01000a^^22220027750^450 005 20240402215411.4 017 $2 DOI 100 $a 20240402d m y slo 03 ba 101 $a eng 102 $a SK 200 1-
$a Fabrication and Characterization of Thermally Oxidized Tungsten-Based Thin Films for Application in Cold Field Emission Sources 215 $a 2 s. $c P 463 -1
$1 001 cav_un_epca*0584783 $1 010 $a 978-80-223-5713-5 $1 200 1 $a SURFINT-SREN VIII. Extended Abstract Book $v S. 20-21 $1 210 $a Bratislava $c Comenius University $d 2023 $1 702 1 $a Brunner $b R. $4 340 610 $a Thermal Oxidation 610 $a Tungsten Tips 610 $a XPS 610 $a AFM 610 $a Cold Field Emmision 700 -1
$3 cav_un_auth*0459316 $a Košelová $b Zuzana $p UPT-D $i D2: Elektronové a plasmové technologie $j D2: Electron and plasma technologies $4 070 $z K $T Ústav přístrojové techniky AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0299810 $a Knápek $b Alexandr $p UPT-D $i D2: Speciální technologie $j D2: New Technologies $w New Technologies $4 070 $T Ústav přístrojové techniky AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0298950 $a Fohlerová $b Z. $y CZ $4 070
Number of the records: 1