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Surface changes induced by Argon plasma treatment of silicon dioxide microparticles
- 1.0583494 - FZÚ 2024 RIV SK eng C - Conference Paper (international conference)
Remeš, Zdeněk - Babčenko, Oleg - Ridzoňová, Katarína - Tesárek, P.
Surface changes induced by Argon plasma treatment of silicon dioxide microparticles.
Proceedings of ADEPT - ADEPT 2023. Žilina: University of Žilina, 2023 - (Jandura, D.; Lettrichová, I.; Kováč, jr., J.), s. 47-50. ISBN 978-80-554-1977-0.
[International Conference on Advances in Electronic and Photonic Technologies /11./ - ADEPT 2023. Podbanské (SK), 12.06.2023-15.06.2023]
R&D Projects: GA MŠMT(CZ) EF16_019/0000760; GA MŠMT(CZ) GA23-05500S
Grant - others:AV ČR(CZ) SAV-23-13
Program: Bilaterální spolupráce
Research Infrastructure: CzechNanoLab II - 90251
Institutional support: RVO:68378271
Keywords : silicon dioxide * inductive coupled plasma * photothermal deflection spectroscopy * photoluminescence spectroscopy
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Plasma treatment is a versatile technique for surface treatment at a relatively low temperature. Silicon dioxide microparticles (average size about 1 micrometer) have been treated in an argon plasma using an inductive coupled plasma (ICP) reactor. The modified SiO2 powder was pressed into pellets and characterized by optical absorptance and photoluminescence spectroscopy. Argon bombardment at low pressure increased optical absorption of SiO2 powder as well as blue photoluminescence indicating an increase in defect states on the surface of the microparticles.
Permanent Link: https://hdl.handle.net/11104/0351456
Number of the records: 1